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Apr 19, 2024
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2020-2022 Undergraduate and Graduate Bulletin (without addenda) [ARCHIVED CATALOG]
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ECE-GY 6493 Design and Test of Digital Systems3 Credits
Logic simulation methods, structural hazards; Manufacturing test fundamentals, fault modeling and simulation, automatic test pattern generation algorithms; Enhancing testability of digital systems: Design for testability; Advanced testing techniques: Test data compaction and compression techniques; Integrated circuits vs System-on-A-Chip (SOC) design styles and their manufacturing test implications.
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