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New York University Polytechnic School of Engineering    
 
    
 
  Jan 17, 2018
 
2013-2014 Undergraduate and Graduate Bulletin (with addenda) [ARCHIVED CATALOG]

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EL-GY 6493 Design and Test of Digital Systems

3 Credits
Logic simulation methods, structural hazards; Manufacturing test fundamentals, fault modeling and simulation, automatic test pattern generation algorithms; Enhancing testability of digital systems: Design for testability; Advanced testing techniques: Test data compaction and compression techniques; Integrated circuits vs System-on-A-Chip (SOC) design styles and their manufacturing test implications.



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